[9] Interfaces and Reliability Engineering

2:35 PM - 2:55 PM JST(5:35 AM - 5:55 AM UTC)

[9-04] Improved Uniformity and Endurance of Ag-based Volatile Memristors via Annealing Engineering

*Yading Yi^1,3, Xujin Song^1,3, Zhuohua Tang^1,3, Shangze Li^1,3, Dijiang Sun^1,3, Shiyue Song^1,3, Yulin Feng², Zheng Zhou^1,3, Peng Huang^1,3, Jinfeng Kang^1,3, Lifeng Liu^1,3 (1. Peking university (China), 2. Beijing Info. Sci. and Tech. Univ. (China), 3. Beijing Advanced Innovation Center for Integrated Circuits (China))