Presentation Information
[B-10A_B-13-08]Nano-Displacement Measurement Method Using Passive Optics with Elliptically Polarized Reference Light
◎Ayumi Ito1, Yasuhiro Okamura1, Masanori Hanawa1 (1. University of Yamanashi)
Keywords:
Elliptical polarization,Displacement measurement,nano-meter,Digital coherent reception,Inter-polarization phase difference,Birefringence