[C-12] 集積回路

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[C-12-06] Evaluation of the voltage fluctuation inside the IC chip by electromagnetic fault injection from Si backside

◎△Rikuu Hasegawa¹, Kazuki Monta¹, Takuya Wadatsumi¹, Takuji Miki¹, Makoto Nagata¹ (1. Kobe University)

Keywords:

EMFI,On-chip monitor circuit