Presentation Information

[A-19-07]Evaluation of the Impact of Measurement Errors on Secret-Key Recoverability in Fault Sensitivity Analysis

〇Yuki Kanaya1, Hikaru Nishiyama2, Daisuke Fujimoto1, Yuichi Hayashi1 (1. NAIST, 2. AIST)

Keywords:

Fault Sensitivity Analysis,Fault Analysis