Session Details
[A-19]Hardware Security
Thu. Sep 11, 2025 1:45 PM - 3:45 PM JST
Thu. Sep 11, 2025 4:45 AM - 6:45 AM UTC
Thu. Sep 11, 2025 4:45 AM - 6:45 AM UTC
Building for General Education (A/B/C) 2F B21(Okayama University)
Chair:Komano Yuichi(Chiba Institute of Technology), Toru Akishita(Sony Semiconductor Solutions Corporation)
[A-19-01]Accuracy Verification of Color QR Code Authentication Using the Spectral Distribution of Smartphone Displays
〇Leon Nakamura1, Kazuo Sakiyama1, Daiki Miyahara1, Yang Li1 (1. The University of Electro-Communications)
[A-19-02]Smartphone password estimation using a hyperspectral camera
〇Kazuki Nishikawa1, Daiki Miyahara1, Yang Li1, Kazuo Sakiyama1 (1. The University of Electro-Communications)
[A-19-03]Evaluation of SAT attack resistance in a Logic-Locking circuit using AES S-Box
〇Yuki Shimmura1, Yuto Takino1, Daiki Miyahara1, Yang Li1, Kazuo Sakiyama1 (1. The University of Electro-Communications)
Break time
[A-19-04]Security Evaluation of Relay Attack Resistance in Side-Channel Authentication
〇Yoshihiro Hatakeyama1, Genki Shinya1, Runa Sako1, Daiki Miyahara1, Yang Li1, Kazuo Sakiyama1 (1. The University of Electro-Communications)
[A-19-05]RF Fingerprint-Based Identification of BLE Devices and Its Application of Relay-Attack Countermeasure
◎Genki Shinya1, Yoshihiro Hatakeyama1, Runa Sako1, Daiki Miyahara1, Yang Li1, Kazuo Sakiyama1 (1. The University of Electro-Communications)
[A-19-06]Extraction of Motor Vibration Data and Creation of Scatter Plot for Individual Identification of Drones
〇Ryota Kobayashi1, Koichi Furuya1 (1. Mitsubishi Electric)
[A-19-07]Evaluation of the Impact of Measurement Errors on Secret-Key Recoverability in Fault Sensitivity Analysis
◎△Yuki Kanaya1, Hikaru Nishiyama2, Daisuke Fujimoto1, Yuichi Hayashi1 (1. NAIST, 2. AIST)