[C-10] Electron Devices

11:45 AM - 12:00 PM JST(2:45 AM - 3:00 AM UTC)

[C-10-06] Potential of a Unified Space-Ground Environment Model for Semiconductor Soft-Error

〇Ryoya Sando¹, Daisuke Kobayashi^1,2 (1. EEIS/UTokyo, 2. ISAS/JAXA)

Keywords:

soft error,semiconductor device,reliability,modeling,radiation