[C-15] Electronics Simulation Technology

11:15 AM - 11:30 AM JST(2:15 AM - 2:30 AM UTC)

[C-15-09] Feature Extraction Method Based on Multi-Step Region Segmentation of Circuit Images and Evaluation of Classification Performance

Yuta Takayama¹, 〇Takuma Akada¹, Kazuhiro Fujimori¹ (1. Okayama Univ.)

Keywords:

microwave planar circuits,machine learning,image analysis,feature extraction