[C-3_C-4] Optoelectronics / Lasers and Quantum Electronics

11:45 AM - 12:00 PM JST(2:45 AM - 3:00 AM UTC)

[C-3_C-4-49] Wafer-level characterization of integrated optical devices using OFDR (3) - Width dependency of distributed reflection coefficients for O-band and C-band Si wire waveguides -

〇Tsuyoshi Horikawa¹, Nobuhiko Nishiyama^1,2 (1. Institute of Science Tokyo, 2. Photonics Electronics Technology Research Association)

Keywords:

silicon photonics,integrated photonic circuits,waveguides,optical frequency domain reflectometry,reflection coefficients,propagation losses