[A-19] Hardware Security

11:15 AM - 11:30 AM JST(2:15 AM - 2:30 AM UTC)Candidate for Academic Incentive Award

[A-19-10] Evaluation of voltage fluctuation inside the chip under the EM irradiation depends on power supply path

◎Rikuu Hasegawa¹, Takuya Wadatsumi^1,2, Kazuki Monta^1,2, Makoto Nagata¹ (1. Kobe University, 2. Secafy Co., ltd.)

Keywords:

Electromagnetic fault injection,Power supply path,On-chip monitor circuit

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