Presentation Information

[B-15-47]A Study on Analysis-Supportive Data Migration for Large-Scale Inspection Data Analysis

〇Taisuke Ueta1, Akinori Matsushita1, Jun Nakamura2, Yoshihisa Uchida2, Hirohito Koike2, Hiroyuki Shindo2 (1. Hitachi, Ltd., 2. Hitachi High-Tech Corporation)

Keywords:

Data Analysis,Data Store,Visualization

Password required to view