[B-4] Electromagnetic Compatibility

2:15 PM - 2:30 PM JST(5:15 AM - 5:30 AM UTC)Candidate for Academic Incentive AwardCareer Explorer

[B-4-38] Investigation of Variations in Injected Levels Caused by Bundled Cables in BCI Test Setups

◎△Io Fukuda¹, Yuto Nawata¹, Masahiro Yosida¹, Yoshitaka Toyota¹ (1. Okayama Univ.)

Keywords:

BCI Test,BCI probe,Bundled cable,parasitic capacitance,Transfer function

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