Session Details
[B-4]Electromagnetic Compatibility
Fri. Sep 25, 2026 1:30 PM - 4:15 PM JST
Fri. Sep 25, 2026 4:30 AM - 7:15 AM UTC
Fri. Sep 25, 2026 4:30 AM - 7:15 AM UTC
C-Bldg C208(Hokkaido University)
Chair:Fujiyuki Nakamoto, Takanori UNOU
[B-4-35]Improving the Calculation Accuracy of Current on Two Parallel Lines with Variable Spacing by Applying Radiation Resistance
◎△Yuito Otani1, Takato Kakuchi1, Takenori Yasuzumi2, Haruki Kuwajima2, Tsuyoshi Tokiwa2, Ryousuke Suga1 (1. Aoyama Gakuin Univ., 2. TOSHIBA Corporation)
[B-4-36]Estimation Accuracy of Magnetic Field from Two Parallel Lines with Variable Spacing
◎△Takato Kakuchi1, Yuito Otani1, Takenori Yasuzumi2, Haruki Kuwajima2, Tsuyoshi Tokiwa2, Suga Ryosuke1 (1. Aoyama Gakuin Univ., 2. Toshiba Corporation.)
[B-4-37]Comparative Evaluation of EMC Stress in a Simulated DUT at the GHz Frequencies
〇Hiroki Ito1, Atsushi Arai2, Hisanori Sugimoto3, Takanori Uno4, Yusuke Yano5 (1. AISIN CORPORATION, 2. TOYO EMC Engineering, 3. KEC Electronic Industry Development Center, 4. DENSO EMC ENGINEERING SERVICE CORPORATION, 5. Nagoya Institute of Technology)
[B-4-38]Investigation of Variations in Injected Levels Caused by Bundled Cables in BCI Test Setups
◎△Io Fukuda1, Yuto Nawata1, Masahiro Yosida1, Yoshitaka Toyota1 (1. Okayama Univ.)
[B-4-39]A Case Study on Receiver Desensitization of a Satellite Communication Terminal near Mobile Base Stations and Mitigation Based on Equivalent Source Estimation
◎Kyohei TOMITA1 (1. Japan Broadcasting Corporation)
Break time
[B-4-40]Contactless Wideband Impedance Estimation with Inductively Coupled Magnetic Probes via Machine Learning
〇Souma Jinno1 (1. Osaka Institute of Technology)
[B-4-41]Measurement of conducted emission of arrayed LED tube lamps.
〇Morimichi Itoh1 (1. Osaka Research Institute of Industrial Science and Technology)
[B-4-42]Quantitative Evaluation of Signal Integrity Degradation Factors Using Design of Experiments in DDR4 Fly-by Topologies
◎Kosei Nagahara1, Goro Hamamoto2,1, Hiroto Miyake1, Masahiro Yoshida1, Yoshitaka Toyota1 (1. Okayama Univ., 2. Hitachi)
[B-4-43]LSTM-Based Eye-Pattern Prediction Flow for SI Characteristics Considering Wiring Structures
◎Koshiro Hirose1, Kensuke Kobayashi1, Masahiro Yoshida1, Yoshitaka Toyota1 (1. Okayama Univ.)
[B-4-44]Semiconductor EMC Modeling Method Using Complex Least Squares and Surrogate Models
〇Koji Ichikawa1, Tetsuya Ishii2 (1. Nagoya Institute of Technology, 2. Keisoku Engineering System Co., Ltd)
