[B-4] Electromagnetic Compatibility

3:45 PM - 4:00 PM JST(6:45 AM - 7:00 AM UTC)Candidate for Academic Incentive Award

[B-4-43] LSTM-Based Eye-Pattern Prediction Flow for SI Characteristics Considering Wiring Structures

◎Koshiro Hirose¹, Kensuke Kobayashi¹, Masahiro Yoshida¹, Yoshitaka Toyota¹ (1. Okayama Univ.)

Keywords:

LSTM,SI Characteristic,Eye Pattern,Signal Integrity

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