[C-12] Integrated Circuit and Devices

4:00 PM - 4:15 PM JST(7:00 AM - 7:15 AM UTC)

[C-12-33] Capacitive Coupling Receiver IC for Contactless Testing of Chiplets Supporting Wide Range of Data Rates

〇Jiawei Huang¹, Michihiro Ide¹, Yohei Sukita¹, Takeaki Takada², Hiroshi Sato², Nobuei Washizu², Makoto Takamiya¹ (1. The University of Tokyo, 2. Advantest Corporation)

Keywords:

Capacitive coupling,Non-contact testing,Chiplet,Receiver

Password required to view