Presentation Information
[C-12-33]Capacitive Coupling Receiver IC for Contactless Testing of Chiplets Supporting Wide Range of Data Rates
〇Jiawei Huang1, Michihiro Ide1, Yohei Sukita1, Takeaki Takada2, Hiroshi Sato2, Nobuei Washizu2, Makoto Takamiya1 (1. The University of Tokyo, 2. Advantest Corporation)
Keywords:
Capacitive coupling,Non-contact testing,Chiplet,Receiver
Three-dimensional integration of chiplets demands high chip yield, while conventional mechanical probing damages fragile micro-bumps, making capacitive-coupling (CC) non-contact testing attractive. However, misalignment and air gaps reduce the coupling capacitance CC to a few femtofarads, attenuating the received signal to millivolts. Moreover, DC voltage baseline wander during long consecutive identical digits (CID) causes false switching, especially in the low-data-rate region, preventing previous weak-feedback receivers from achieving a wide data-rate range. This paper proposes a highly sensitive CC communication IC operating over a wide data-rate range from 1 kbps to 1.2 Gbps.