[C-12] 集積回路

16:00 〜 16:15

[C-12-33] Capacitive Coupling Receiver IC for Contactless Testing of Chiplets Supporting Wide Range of Data Rates

〇Jiawei Huang¹, Michihiro Ide¹, Yohei Sukita¹, Takeaki Takada², Hiroshi Sato², Nobuei Washizu², Makoto Takamiya¹ (1. The University of Tokyo, 2. Advantest Corporation)

キーワード：

Capacitive coupling、Non-contact testing、Chiplet、Receiver

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