Presentation Information

[C-2B-18]Effective Complex Permittivity Measurement of Thin Film Coated Substrates Using a Millimeter-Wave Circular Empty Cavity Resonator

〇TAKASHI SHIMIZU1 (1. Utsunomiya University)

Keywords:

circular empty cavity resonator,thin film,complex permittivity,millimeter wave

In this study, the effective complex permittivity of thin-film-coated LCP film substrates was measured using a circular empty cavity resonator in the 36 GHz band. A clear difference was detected between the uncoated substrate and the coated substrate with a 2 μm-thick film.