講演情報
[8a-B32-3]In-situ Full-Stroke Calibration of an AFM Head-Piezo for Large-Amplitude Tissue Indentation: Offset-Resolved Hysteresis Recovery from Local Minor Loops
〇(P)Stefan Baar1, Feng-Yueh Chan2, Hiroki Nojima1, Takayuki Uchihashi2, Takaharu Okajima1 (1.Hokkaido University, 2.Nagoya University)
キーワード：
Atomic Force Microscopy (AFM)、Piezoelectric Actuators、Nanomechanical Characterization
High-speed atomic force microscopy (HS-AFM) maps mechanical properties of soft tissue via deep indentation. This requires driving the piezo actuator with a large sinusoid and varying offset, introducing complex nonlinearities like variable gain and hysteresis. Accurate stiffness extraction demands characterizing this hysteresis across the full stroke, but current in-situ methods fail without specialized external sensors.
To solve this, we reconstruct the complete, offset-resolved hysteresis in place using only the calibrated positioning stage. We measure overlapping minor loops at varying frequencies to separate rate-independent (Preisach) and viscous components. Stitching these loops together builds a comprehensive, full-range model.
Simulations confirm this method accurately recovers the full hysteresis and offset-dependent gain. This enables the precise, large-indentation HS-AFM using standard electronics, without dismounting the actuator or using an external interferometer.
To solve this, we reconstruct the complete, offset-resolved hysteresis in place using only the calibrated positioning stage. We measure overlapping minor loops at varying frequencies to separate rate-independent (Preisach) and viscous components. Stitching these loops together builds a comprehensive, full-range model.
Simulations confirm this method accurately recovers the full hysteresis and offset-dependent gain. This enables the precise, large-indentation HS-AFM using standard electronics, without dismounting the actuator or using an external interferometer.