講演情報

[C-12-30]Design of Closed-Loop Active Gate Driver IC with Real-Time Gate Current Control for GaN HEMTs

〇Juntian Chen1, Hiroki Fukunaga1, Bingchen Wu1, Daichi Hirotsuka1, Yaogan Liang1, Michihiro Ide1, Makoto Takamiya1 (1. The University of Tokyo)

キーワード:

active gate driver、GaN HEMT、switching loss、overshoot、22 nm、feedback

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