[2F01-05] Measurement

10:30 AM - 10:45 AM JST(1:30 AM - 1:45 AM UTC)

[2F05] Estimation of energy spectra of light charged particles emitted from muon-nuclear capture reaction on Si using an unfolding technique

*Kentaro Kitafuji¹, Shoichiro Kawase¹, Teppei Kawata¹, Yukinobu Watanabe¹, Megumi Niikura², Rurie Mizuno³, Dai Tomono⁴, Katsuhiko Ishida⁵, Adrian Hillier⁶ (1. Kyushu Univ., 2. RIKEN, 3. UTokyo, 4. Osaka Univ., 5. KEK, 6. RAL)

Keywords:

muon-nuclear capture reaction,soft error,light charged particle,energy spectrum,unfolding

Temporary malfunctions that occur when radiation inject into the semiconductor devices in electronic device are called “soft error”. The main cause of soft errors is cosmic rays and cosmic ray negative muons cause muon-nuclear capture reaction when they stop in semiconductor devices, and secondary light charged particles (LCPs) are generated. Since these LCPs also cause soft error, energy spectra of LCPs emitted from muon-nuclear capture reaction is important to predict the soft error rate. Therefore, we measured the LCPs emitted from muon-nuclear capture reaction on Si at the Rutherford Appleton Laboratory and estimated the energy spectra using an unfolding technique.