Presentation Information

[2K18]Basic Research Programs of Vitrification Technology for Waste Volume Reduction(129) Structural investigation of borosilicate glasses by using XAFS measurement in soft X-ray region

*Takayuki Nagai1, Yoshihiro Okamoto1, Daisuke Shibata2, Kazuo Kojima2, Takehiko Hasegawa3, Seiichi Sato3, Akane Fukaya4, Kiyoshi Hatakeyama4 (1. JAEA, 2. SR center, Ritsumeikan Univ., 3. Inspection Development Co., 4. E&E Techno Service Co.)

Keywords:

vitrification,Borosilicate glass,XAFS,Raman spectrometry,Boron,Silicon,Cerium

模擬廃棄物ガラス塊の凝固表層と切断面を対象に,ガラス成分のB,Si等のK吸収端及び廃棄物成分のCeのL3吸収端をXAFS測定し,ガラス塊の部位による構成元素の化学状態の相違を比較した.

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