Presentation Information
[1B13]Basic research programs of vitrification technology for waste volume reduction.(137) Investigation of simulated waste glasses by using XAFS measurement in soft X-ray region.
*Takayuki Nagai1, Yoshihiro Okamoto1, Daisuke Shibata2, Kiyotaka Asakura2, Takehiko Hasegawa3, Seiichi Sato3, Tetsuya Kikuchi4, Kiyoshi Hatakeyama4 (1. JAEA, 2. SR center, Ritsumeikan Univ., 3. Inspection Development Co., 4. E&E Techno Service Co.)
Keywords:
vitrification,Borosilicate glass,XAFS,Raman spectrometry,LA-ICP,Boron,Silicon,Cerium
模擬廃棄物ガラス塊の凝固表層と切断面のB,Si,Ce等をXAFS測定し,部位による元素の化学状態の変化を評価するとともに,ガラス塊の凝固表層断面をLA-ICP分析し,表面から深さ方向の組成変化を確認した.
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