[2B09-13] Deburis 2

2:45 PM - 3:00 PM JST(5:45 AM - 6:00 AM UTC)

[2B09] Development and application of mapping analysis methods for elements, compounds, and valences using XRF, XRD, and XAFS in the same field of view with synchrotron microbeams

*Hajime Tanida¹, Ryo Endo², Daisuke Akiyama², Yoshihiro Okiamoto¹, Akira Kirishima² (1. JAEA, 2. Tohoku Univ.)

Keywords:

Synchrotoron radiation,Micro Beam,Mapping,Chemicals,Valences

Using high-brightness synchrotron radiation from SPring-8, X-rays were focused to 1 micrometer, mapping measurements were performed on mico-samples, element maps using fluorescent X-rays and compound maps using X-ray diffraction were obtained, and X-ray absorption spectra were measured at specific locations to evaluate the valence of elements. This system was applied to 1F simulated debris particle samples. This system can obtain bulk information under atmospheric pressure and non-destructively, and can reveal the correlation between the elemental composition of particles and compounds, crystal structures, and oxidation states. In the future, measurements under varying temperatures, humidity, and gas atmospheres will also be possible.