Presentation Information
[9-02][Invited] Critical issues and limitations in p-GaN HEMTs technology
*Giuseppe Greco1, P. Fiorenza1, S. Milazzo1, F. Giannazzo1, G. Giorgino2, C. Miccoli2, E. Castagna2, F. Iucolano2, F. Roccaforte1 (1. IMM, National Research Council of Italy (Italy), 2. STMicroelectronics (Italy))