Presentation Information
[9-06]Understanding the reduced current collapse in Schottky-gate AlGaN/GaN HEMTs with vanadium-based metal stack ohmic contact
*Naeemul Islam1, Takahiro Igarashi1, Kishi Sekiyama1, Suguru Terai1, Shundai Yamao 1, Shogo Maeda1, Ali Baratov 1, Masaaki Kuzuhara2, Joel T. Asubar1 (1. Univ. of Fukui (Japan), 2. Kwansei Gakuin Univ. (Japan))