[P3] Poster Session 3

[P3-32] A new tender XAFS system for characterization of organic thin films at SAGA light source

*Hiroyuki Setoyama¹, Takeshi Watanabe², Masahide Kawamoto¹, Ichiro Hirosawa¹ (1. SAGA-LS (Japan), 2. JASRI (Japan))

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