General Conference of the Institute of Electronics, Information and Communication Engineers
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Presentation Information

1:45 PM - 2:15 PM JST(4:45 AM - 5:15 AM UTC)

[AI-4-01](from HOST 2025) ML-EMFI: A Machine Learning-Driven Pre-Silicon Electromagnetic Fault Injection Security Evaluation for Robust IC Design

Pantha Protim Sarker2, Tianze Kan3, Jingchen Liang3, Ozgur Tuncer3, Bo He3, Zelin Lu3, Sudarshan Mallu3, Lang Lin3, Norman Chang3, 〇Rikuu Hasegawa1, Kazuki Monta1, Makoto Nagata1, Farimah Farahmandi2, Mark Tehranipoor2 (1. Kobe University, 2. University of Florida, 3. Ansys, Inc.)

Keywords:

Electromagnetic fault injection,Machine learning

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