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Evaluation of Parasitic Inductance in a Half-bridge Circuit for Noise Source Modeling

<a style="color: #ffffff; background-color: #3598db;" href="https://us02web.zoom.us/j/82202684204" target="_blank" rel="noopener">　Online Attendance (ZOOM)　</a>

Recent EMC issues have become more complex due to the high-frequency signals and the speed of semiconductor-based switching. This has made it necessary to consider not only the effects between separated devices but also issues in smaller areas such as in a circuit board and nearby components. In such micro-EMC issues, simulation technology plays a crucial role, but the validity and reliability of these simulations can be confirmed by measurement data. In the present session, we will conduct a comprehensive consideration of numerical simulation and measurement techniques currently employed in the latest component-level EMC research.

Measurement and Simulation Technologies for Micro EMC

General Conference of the Institute of Electronics, Information and Communication Engineers

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[BI-3-04]Evaluation of Parasitic Inductance in a Half-bridge Circuit for Noise Source Modeling

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