[C-12] Integrated Circuit and Devices

4:30 PM - 4:45 PM JST(7:30 AM - 7:45 AM UTC)Candidate for Academic Incentive Award

[C-12-56] Design of Dynamic Soft Error Measurement Circuit in a 22 nm Bulk Process

◎Yusaku Nakaoka¹, Shuhei Mandai¹, Arata Matsumoto¹, Ryuichi Nakajima¹, Jun Furuta², Kazutoshi Kobayashi¹ (1. Kyoto Institute of Technology, 2. Okayama Prefectural University)

Keywords:

soft error,dynamic soft error measurement,single event transient,operating frequency,radiation effects,pulse width fluctuation,single event upset,frequency dependence