Presentation Information
[T10-P-4]Analysis of identification and chemical states of graphene oxide in fault gouge using X-ray photoelectron spectroscopy
*Tomoya SHIMADA1, Hiroyuki NAGAHAMA1, Jun MUTO1, Norihiro NAKAMURA2 (1. Graduate School of Science, Department of Earth Science, Tohoku University, 2. Tohoku Gakuin University)
Keywords:
Graphene oxide,Raman spectroscopy,X-ray photoelectron spectroscopy,Fault gouge,Oxygen-containing functional groups
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