[FMC9/VHF6] Display Measurements and Inspections

2:50 PM - 3:10 PM JST(5:50 AM - 6:10 AM UTC)

[FMC9/VHF6-3] Design of a 4-Channel Scanning Acoustic Microscopy System with Synthetic Aperture Focusing for High-Resolution Defect Detection in OLED Displays

*Hwijin Kim¹, Sohyun Won¹, Seoyoung Jang¹, Heechul Yoon¹ (1. Dankook University (Korea))

Keywords:

Wafer,Non-destructive testing,Scanning acoustic microscopy,Synthetic aperture focusing

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