The 32nd International Display Workshops (IDW '25)
Advanced Search

Session Details

Oral PresentationWorkshop on FPD Manufacturing, Materials and Components (FMC) : [FMC9/VHF6] Display Measurements and Inspections

[FMC9/VHF6]Display Measurements and Inspections

Fri. Dec 5, 2025 2:10 PM - 3:30 PM JST
Fri. Dec 5, 2025 5:10 AM - 6:30 AM UTC
Dahlia 1
Chair: Johan Bergquist (Consultant)
Co-Chair: Yuzo Hisatake (Shizuoka University)
2:10 PM - 2:30 PM JST(5:10 AM - 5:30 AM UTC)

[FMC9/VHF6-01]Novel Method for Evaluating Temporal Accuracy on Refresh Rate of Display

*Hyunah Suh1, Dongyeol Yeom1, Hyosun Kim1, Yongwoo Yi1, Jaejoong Kwon1 (1. Samsung Display (Korea))
Comment()
2:30 PM - 2:50 PM JST(5:30 AM - 5:50 AM UTC)

[FMC9/VHF6-02]Metrology Errors in On- and Off-Axis Curved Displays Caused by Measurement Field Distorted Geometry

K Käläntär1,2, Heyder Khalilov2, *Elgün Tağiyev2 (1. Global Optical Solutions (Japan), 2. Nakhchivan State University (Azerbaijan))
Comment()
2:50 PM - 3:10 PM JST(5:50 AM - 6:10 AM UTC)

[FMC9/VHF6-03]Design of a 4-Channel Scanning Acoustic Microscopy System with Synthetic Aperture Focusing for High-Resolution Defect Detection in OLED Displays

*Hwijin Kim1, Sohyun Won1, Seoyoung Jang1, Heechul Yoon1 (1. Dankook University (Korea))
Comment()
3:10 PM - 3:30 PM JST(6:10 AM - 6:30 AM UTC)

[FMC9/VHF6-04L]Evaluation of Display Films Using a Three-Dimensional Optical Wave Field Microscope (3D-OWFM)

*Kensaku Shimoda1, Shimon Matsumoto1 (1. Otsuka Electronics Co., Ltd. (Japan))
Comment()
Back to Category List