[O1-3] Monitoring and Diagnostics of Semiconductor Devices and Capacitors

11:15 AM - 11:35 AM JST(2:15 AM - 2:35 AM UTC)

[O1-3-01] Analysis of Relationship between Gate Drive Condition and Detection Sensitivity of Bond Wire Lift-Off in IGBT Modules using Convolutional Neural Networks (CNNs)

*Thatree Mamee¹, Katsuhiro Hata², Makoto Takamiya³, Takayasu Sakurai³, Shin-ichi Nishizawa⁴, Wataru Saito⁴ (1. Pilot Plant Development and Training Institute (PDTI), King Mongkut’s University of Technology Thonburi (KMUTT) (Thailand), 2. College of Engineering, Shibaura Institute of Technology (Japan), 3. Institute of Industrial Science, The University of Tokyo (Japan), 4. Research Institute for Applied Mechanics, Kyushu University (Japan))

Keywords:

Bond wire lift-off,Convolutional neural networks (CNNs),Gate waveform sensitivity,IGBT modules