[O1-3] Monitoring and Diagnostics of Semiconductor Devices and Capacitors | IPEC2026

Session Details

Regular SessionSemiconductor Power Conversion : Emerging technologies in Packaging, thermal management, system integration and Reliability (Advanced fault protection systems, Diagnostics)

[O1-3]Monitoring and Diagnostics of Semiconductor Devices and Capacitors

Mon. Jun 1, 2026 11:15 AM - 12:35 PM JST
Mon. Jun 1, 2026 2:15 AM - 3:35 AM UTC

Room 101C(1F)

Chair:Guo-Quan Lu(Virginia Tech), Kenji Natori(Chiba University)

11:15 AM - 11:35 AM JST(2:15 AM - 2:35 AM UTC)

[O1-3-01]Analysis of Relationship between Gate Drive Condition and Detection Sensitivity of Bond Wire Lift-Off in IGBT Modules using Convolutional Neural Networks (CNNs)

*Thatree Mamee¹, Katsuhiro Hata², Makoto Takamiya³, Takayasu Sakurai³, Shin-ichi Nishizawa⁴, Wataru Saito⁴ (1. Pilot Plant Development and Training Institute (PDTI), King Mongkut’s University of Technology Thonburi (KMUTT) (Thailand), 2. College of Engineering, Shibaura Institute of Technology (Japan), 3. Institute of Industrial Science, The University of Tokyo (Japan), 4. Research Institute for Applied Mechanics, Kyushu University (Japan))

11:35 AM - 11:55 AM JST(2:35 AM - 2:55 AM UTC)

[O1-3-02]Fully Integrated Active Gate Driver IC With Real-Time Timing Control of Drive-Strength Switching Using Gate Current Sensing for SiC MOSFETs

Taiyu Liu¹, Makoto Takamiya¹, Michihiro Ide¹, *Makoto Takamiya¹ (1. The University of Tokyo (Japan))

11:55 AM - 12:15 PM JST(2:55 AM - 3:15 AM UTC)

[O1-3-03]Condition Monitoring of a DC-link Capacitor with the Instantaneous Output Power of a Propulsion Inverter with One-Pulse Modulation

*Kazunori Hasegawa¹ (1. Kyushu Institute of Technology (Japan))

12:15 PM - 12:35 PM JST(3:15 AM - 3:35 AM UTC)

[O1-3-04]Analysis and Experimental Verification of Current Sharing among Parallel-Connected DC-Link Capacitors with Stray Inductances

*Kazunori Hasegawa¹, sakurako Nasu¹ (1. Kyushu Institute of Technology (Japan))

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