[O1-3] Monitoring and Diagnostics of Semiconductor Devices and Capacitors

11:35 AM - 11:55 AM JST(2:35 AM - 2:55 AM UTC)

[O1-3-02] Fully Integrated Active Gate Driver IC With Real-Time Timing Control of Drive-Strength Switching Using Gate Current Sensing for SiC MOSFETs

Taiyu Liu¹, Makoto Takamiya¹, Michihiro Ide¹, *Makoto Takamiya¹ (1. The University of Tokyo (Japan))

Keywords:

active gate driver,gate current sensing,SiC MOSFET,trade-off curve