[O1-3] Monitoring and Diagnostics of Semiconductor Devices and Capacitors

12:15 PM - 12:35 PM JST(3:15 AM - 3:35 AM UTC)

[O1-3-04] Analysis and Experimental Verification of Current Sharing among Parallel-Connected DC-Link Capacitors with Stray Inductances

*Kazunori Hasegawa¹, sakurako Nasu¹ (1. Kyushu Institute of Technology (Japan))

Keywords:

12345