[O7-8] EMI Reduction and Reliability in Next-Generation Power Electronics

4:40 PM - 5:00 PM JST(7:40 AM - 8:00 AM UTC)

[O7-8-02] Noise Feedback Mechanisms Causing Turn-Off Switching Instability for Next-Generation Power Devices Packaged in Power Module

*Hiroto Sakai^1,2, Kotaro Kobashi¹, Masataka Ishihara², Kazuhiro Umetani³, Eiji Hiraki² (1. ROHM Co., Ltd. (Japan), 2. Okayama Univ. (Japan), 3. Kyushu Univ. (Japan))

Keywords:

Oscillation,Power Module,Parallel Switching,Stability