R1: Characterization and description of minerals (Joint Session with The Gemmological Society of Japan)

12:30 PM - 2:00 PM JST(3:30 AM - 5:00 AM UTC)

[R1P-08] Trace element analysis in Plagioclase by EPMA

*Naoki Katou¹, Shinichi Hayashi¹, Rie Wakimoto¹ (1. JEOL Ltd.)

Keywords:

Electron Probe MicroAnalyzer,Trace element analysis

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