Presentation Information

[IS2.2]Grain-engineered Co Alloys for Scaled Interconnects

*KIYOUNG LEE1 (1. Department of Materials Science & Engineering, HONGIK UNIVERSITY, Seoul, Korea)

Keywords:

Scaled Interconnect,Resistivity Size Effect,Grain Boundary Scattering,Co Alloys,Thin Films

Ultrathin Co alloys show reduced resistivity scaling by improving electron transmission at grain boundaries through microstructural engineering.

Comment

To browse or post comments, you must log in.Log in