[19a-A307-1~10] 2.1 Detection Devices

9:45 AM - 10:00 AM JST(12:45 AM - 1:00 AM UTC)

[19a-A307-4] Study on two-dimensional carrier transport characterization system of TlBr crystals

〇(B)Yusuke Sugai¹, Sota Hasegawa¹, Kenichi Watanabe¹, Keitaro Hitomi², Mitsuhiro Nogami² (1.Kyushu Univ., 2.Tohoku Univ.)

Keywords:

compound semiconductor,thallium bromide

In order to investigate the relationship between the crystallinity and orientation of TlBr and its carrier transport properties, a time-of-flight (TOF) system for evaluating carrier mobility generated by a pulsed laser was investigated. This system enables the two-dimensional distribution of carrier transport properties to be evaluated by scanning the laser irradiation position, which can be compared with the crystal orientation distribution of TlBr obtained by electron beam backscattering (EBSD). In the present study, the mobility of electrons and holes was measured.