[19p-A601-1~9] 7.1 X-ray technologies

2:15 PM - 2:30 PM JST(5:15 AM - 5:30 AM UTC)

[19p-A601-5] High Energy X-ray CT Measurements
-Comparative Verification against Light Sheet 3D Imaging using High Energy X-rays-

〇Takayoshi Shimura¹, Kentaro Kajiwara², Naruki Tsuji², Takuma Kobayashi¹, Heiji Watanabe¹ (1.Osaka Univ., 2.JASRI)

Keywords:

x-ray,computer tomography,backscattered x-ray imaging

We have been studying high-angle scattered X-ray imaging, in which we do not need to place a detector behind the object. It also has the advantages that it can be applied to objects larger than X-ray beam size and has a relatively high sensitivity to light element materials. In autum meeting of 2023, we reported the measurement results using high-energy synchrotron white X-rays with a central energy of approximately 100 keV as illumination light. In this report, we demonstrate CT measurement using the same high-energy synchrotron white X-rays to discus comparative verification with scattered X-ray imaging.