[19p-D903-1~15] 12.2 Characterization and Materials Physics

2:45 PM - 3:00 PM JST(5:45 AM - 6:00 AM UTC)

[19p-D903-5] Characterization of Organic Semiconductor Thin Films by Tender XAFS Measurements

〇Hiroyuki Setoyama¹, Takeshi Watanabe², Ryuto Sato³, Noriyuki Yoshimoto³, Ichiro Hirosawa¹ (1.SAGA-LS, 2.JASRI, 3.Iwate Univ.)

Keywords:

Tender XAFS,DNTT,O-TFT

Tender X-ray absorption spectroscopy (Tender XAFS), which uses X-rays with energies between 2 and 5 keV, is a technique for obtaining information on element-selective chemical states and coordination environments. It has also highly applicable, requiring no high vacuum. Using this method, we investigated the effect of continuous driving of top contact DNTT TFTs on the chemical state of DNTT. Prior to the measurement, repeated Tender XAFS measurements of DNTT thin film samples were performed to confirm that X-ray irradiation does not cause significant denaturation of the DNTT thin film samples.