Presentation Information
[19p-P02-1]Development of XAFS method for dilute sample in actual devices
〇Tomoya Uruga1, Takuma Kaneko1 (1.JASRI)
Keywords:
XAFS,X-ray,Synchrotron radiation
X-ray absorption fine structure (XAFS) spectroscopy is a powerful method to obtain chemical state and local structure information of the target element in crystalline and non-crystalline samples. In this study, we developed a XAFS measurement method for dilute sample in actual devices with high X-ray absorption, which has been difficult to measure so far, and successfully conduced test measurement. We will present the outline of the measurement method and test measurement results.