[20a-A310-1~10] CS.1 Code-sharing Session of 2.3 & 7.4

11:15 AM - 11:30 AM JST(2:15 AM - 2:30 AM UTC)Presentation by Applicant for JSAP Young Scientists Presentation Award

[20a-A310-9] Incident particle dependence of the energy of secondary electrons emitted from monolayer graphene by fast cluster ion beam irradiation

〇(M2)Naruki Uno¹, Takuya Majima¹, Manabu Saito¹, Hidetsugu Tsuchida¹ (1.Kyoto Univ.)

Keywords:

cluster beam,secondary electron,monolayer graphene

The fast cluster ion beam has unique irradiation effects and is expected to be applied in material analysis. Measuring the energy of the generated secondary electrons contributes to understanding the energy transfer process. To address the issue of target foil thickness, a monolayer graphene was used. In the presentation, the results show the analysis of the energy distribution of secondary electrons caused by fast cluster ion beam irradiation, focusing on the differences in energy transfer by incident particles using the dielectric response function.