Presentation Information
[20p-A306-9]Evaluation of electrical properties in graphene - n-type SiC junction
〇Hideyo Yokome1, Yasuhide Ohno1, Masao Nagase1 (1.Tokushima Univ.)
Keywords:
graphene,n-type SiC,schottky barrier junction
Graphene-SiC junctions have been confirmed to form Schottky junctions. However, there are many unknowns about the junction of epitaxial graphene and SiC. In this study, the electrical properties of graphene/buffer layer/n-type SiC junctions were investigated using atomic force microscopy (AFM). As a result of the measurements, rectifiability was observed, with a Schottky barrier height of 0.32 eV in the forward direction and a rapid current flow around about 0.5 V in the reverse direction.