[21p-A304-1~9] Recent Progress of Research Methods in Thin film and Surface Physics

2:30 PM - 3:00 PM JST(5:30 AM - 6:00 AM UTC)

[21p-A304-3] Autonomous X-ray measurements and data analysis

〇Kanta Ono¹ (1.Osaka Univ.)

Keywords:

Autonomous experimentation

Advanced characterization using quantum beams such as X-rays has become indispensable for thin film, surface, and interface research. However, measurement and analysis using X-rays have problems, such as the effective use of limited beam time at synchrotron radiation facilities or the efficiency of relatively long measurement time at laboratory X-ray sources. In order to solve these problems, we are conducting research aiming at highly efficient and autonomous X-ray measurement and analysis using machine learning.