Presentation Information

5:15 PM - 5:45 PM JST(8:15 AM - 8:45 AM UTC)

[21p-A304-8]Nanoscale Structural Characterizations of 2D Materials using Surface Microscopy

〇Hiroki Hibino¹ (1.Kwansei Gakuin Univ.)

Keywords:

low-energy electron microscopy,two-dimensional materials

Low-energy electron microscopy (LEEM) is a surface microscopy technique that combines ~10 nanometer spatial resolution with video-rate temporal resolution, which makes it a powerful tool for analyzing the growth mechanisms and structures of two-dimensional (2D) materials. Towards the controlled growth of 2D materials and their heterostructures, we have utilized LEEM to analyze the structures of 2D materials during and after growth in detail. In this presentation, we introduce examples of these studies to elucidate the advantages of LEEM as a structural analysis method for 2D materials.

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