Presentation Information
[21p-P17-6]Development of high-resolution spectrometer for free-induction decay by high-intensity THz pulse excitation
〇Nozomi Shimono1, Furuya Takashi2, Kitahara Hideaki2, Moriyasu Takeshi1, Tani Masahiko2 (1.Sch. Eng, UF, 2.FIR UF)
Keywords:
High resolution spectroscopy,free induction decay
We are developing a high-resolution spectroscopy technique that uses broadband terahertz pulses as an excitation source and detects FID emitted from molecules using a harmonic mixer.We need to eliminate excitation pulses with high peak values due to detector damage threshold issues, and are planning to introduce semiconductor shutters.We report the results of carrier lifetime measurements of semiconductors used in semiconductor shutters and the possibility of FID detection.