[22a-A307-1~9] 6.6 Probe Microscopy

10:45 AM - 11:00 AM JST(1:45 AM - 2:00 AM UTC)

[22a-A307-6] Consideration of a design of a current amplifier and the reduction of a capacitive noise from the nanopipette probe for high-bandwidth and low-noise SICM measurements

〇Shoma Kamei¹, Shinzi Watanabe² (1.NanoLS,Kanazawa Univ., 2.WPI-NanoLSI, Kanazawa Univ.)

Keywords:

Trans Impedance Amplifier,nanopipette technique