Session Details
[22a-A307-1~9]6.6 Probe Microscopy
Fri. Sep 22, 2023 9:30 AM - 11:45 AM JST
Fri. Sep 22, 2023 12:30 AM - 2:45 AM UTC
Fri. Sep 22, 2023 12:30 AM - 2:45 AM UTC
A307 (KJ Hall)
Yoshiaki Sugimoto(Univ. of Tokyo)
[22a-A307-1][Young Scientist Presentation Award Speech] Effect of ionic liquid components on solvation structures at ionic liquid / charged solid interfaces detected by atomic force microscopy
〇Yifan Bao1, Takashi Ichii1, Toru Utsunomiya1, Hiroyuki Sugimura1 (1.Kyoto Univ.)
[22a-A307-2]Carrier Distribution Observation by SCFM for Degradation Analysis of Barium Titanate Multilayer Ceramic Capacitors
〇Masaki MasakiSumi Sumi1, Yuki Oyama1, Nobuo Satoh1 (1.Chiba Institute of Tech.)
[22a-A307-3]Visualization of Subnanometer-Scale Charge Distribution at the Ionic Liquid/Gold Electrode Interface by Open-Loop Electric Potential Microscopy
〇Takahiko Ikarashi1, Takashi Sumikama1, Kaito Hirata2, Keisuke Miyazawa1, Kazuki Miyata1, Sunao Shimizu3, Yoshihiro Iwasa4,5, Takeshi Fukuma1 (1.Kanazawa Univ., 2.Nagoya Univ., 3.CROEPI, 4.Dept. of Eng., The Univ. of Tokyo, 5.RIKEN CEMS)
[22a-A307-4]Analysis of the correlation between KFM data and intermetallic compound distribution by using machine learning
〇Yuya Takara1, Takahiro Ozawa1 (1.KOBE STEEL, LTD.)
[22a-A307-5]Fabrication of Cr/MgO tips for STS application
〇Yuki Yamada1, Agus Subagyo1, Muraji Watanabe1, Eko Ishihara1, Eiji Hatta1, Kazuhisa Sueoka1 (1.Hokkaido Univ.)
[22a-A307-6]Consideration of a design of a current amplifier and the reduction of a capacitive noise from the nanopipette probe for high-bandwidth and low-noise SICM measurements
〇Shoma Kamei1, Shinzi Watanabe2 (1.NanoLS,Kanazawa Univ., 2.WPI-NanoLSI, Kanazawa Univ.)
[22a-A307-7]Development of Zero-Latency Amplitude Detector Towards Next-Generation Ultrafast High-Speed AFM
〇(PC)Kenichi Umeda1,2, Karen Kamoshita3, Kazuma Tatsumi3, Noriyuki Kodera1 (1.WPI-NanoLSI, Kanazawa Univ., 2.JST-PRESTO, 3.Grad. Sch. Math. & Phys., Kanazawa Univ.)
[22a-A307-8]Improvement in scanner response by digital filtering with a stable filtered inverse system
〇Kazuki Miyashita1, Shinji Watanabe2 (1.Math. &Phys., Kanazawa Univ., 2.WPI-NanoLSI, Kanazawa Univ.)
[22a-A307-9]Heat Assisted Ferroelectric Reading for Ultra-Fast SNDM Probe Memory
〇Yasuo Cho1 (1.Tohoku University)