[22p-B205-1~19] 12.1 Fabrications and Structure Controls

2:30 PM - 2:45 PM JST(5:30 AM - 5:45 AM UTC)Presentation by Applicant for JSAP Young Scientists Presentation Award

[22p-B205-5] Structural Rearrangements in Ph-BTBT-C_n Thin Films Revealed by In-situ Temperature-dependent Measurements

〇Takayuki Oka¹, Nobutaka Shioya¹, Shingo Maruyama², Takeshi Hasegawa¹ (1.Kyoto Univ., 2.Tohoku Univ.)

Keywords:

IR spectroscopy,smectic E phase,organic semiconductor

Ph-BTBT-C_n has excellent performances as an active layer in organic thin-film transistors. We have revealed temperature-dependent structural rearrangements in Ph-BTBT-C_n thin films by in-situ X-ray diffraction and infrared spectroscopy.